发明名称 SEMICONDUCTOR STORAGE DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a capacitor cell whose formation method is easy and relatively high integration is possible in a semiconductor memory, etc., wherein a ferroelectric thin film which shows ferroelectricity by using an epitaxial effect or a ferroelectric thin film wherein ferroelectricity is reinforced by the eptiaxial effect is used. SOLUTION: The device is constituted having a memory cell array wherein a memory cell constituted of a transistor and a capacitor is arranged in a matrix on a semiconductor board 1. A barrier metallic layer 12, a lower electrode layer 13 and a ferrolelectric film 14 are subjected to eptiaxial growth or orientation growth one by one for the side of the board/inside a contact hole manufactured on a source or drain electrode 6 of the transistor or its extended conductive layer for constituting the capacitor.
申请公布号 JPH10270651(A) 申请公布日期 1998.10.09
申请号 JP19970070999 申请日期 1997.03.25
申请人 TOSHIBA CORP 发明人 KAWAKUBO TAKASHI;SANO KENYA;YANASE NAOKO;ABE KAZUHIDE;KOMATSU SHUICHI
分类号 H01L21/8247;H01L21/822;H01L21/8242;H01L21/8246;H01L27/04;H01L27/10;H01L27/105;H01L27/108;H01L29/788;H01L29/792 主分类号 H01L21/8247
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