发明名称 |
SEMICONDUCTOR STORAGE DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a capacitor cell whose formation method is easy and relatively high integration is possible in a semiconductor memory, etc., wherein a ferroelectric thin film which shows ferroelectricity by using an epitaxial effect or a ferroelectric thin film wherein ferroelectricity is reinforced by the eptiaxial effect is used. SOLUTION: The device is constituted having a memory cell array wherein a memory cell constituted of a transistor and a capacitor is arranged in a matrix on a semiconductor board 1. A barrier metallic layer 12, a lower electrode layer 13 and a ferrolelectric film 14 are subjected to eptiaxial growth or orientation growth one by one for the side of the board/inside a contact hole manufactured on a source or drain electrode 6 of the transistor or its extended conductive layer for constituting the capacitor. |
申请公布号 |
JPH10270651(A) |
申请公布日期 |
1998.10.09 |
申请号 |
JP19970070999 |
申请日期 |
1997.03.25 |
申请人 |
TOSHIBA CORP |
发明人 |
KAWAKUBO TAKASHI;SANO KENYA;YANASE NAOKO;ABE KAZUHIDE;KOMATSU SHUICHI |
分类号 |
H01L21/8247;H01L21/822;H01L21/8242;H01L21/8246;H01L27/04;H01L27/10;H01L27/105;H01L27/108;H01L29/788;H01L29/792 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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