发明名称 REACTIVE ION ETCHING APPARATUS
摘要 PROBLEM TO BE SOLVED: To enable the dry etching adaptable to microfabrication below specified width, irrespective of the pressure by using a wide antenna as a single- winding high frequency coil for generating a discharge plasma and feeding a more amt. of gas than the vol. of a discharging chamber above a substrate. SOLUTION: A cylindrical vacuum chamber 1 has a top part made from a disk-like dielectric 2. A magnetic field generating means for forming an annular magnetic neutral line is composed of a small-diameter disk-like or doughnut- like permanent magnet 3 disposed on the top of the dielectric 2 and annular permanent magnet 4 having a larger inner diameter than the magnet 3. A wide antenna disposed between the two magnets 3, 4 forms a single-winding high frequency coil 5 for generating a discharge plasma. An etching gas to be fed is controlled so that its flow rate is 15(±3)×V sccm where the vol. of a reaction chamber is V lit. Thus a reactive dry etching apparatus adaptable to fine machining below 0.3μm width can be realized.
申请公布号 JPH10270422(A) 申请公布日期 1998.10.09
申请号 JP19970072173 申请日期 1997.03.25
申请人 ULVAC JAPAN LTD;HORIIKE YASUHIRO 发明人 HORIIKE YASUHIRO;HAYASHI TOSHIO
分类号 H05H1/46;C23F4/00;H01J37/305;H01L21/205;H01L21/302;H01L21/3065;(IPC1-7):H01L21/306 主分类号 H05H1/46
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