发明名称 |
REACTIVE ION ETCHING APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To enable the dry etching adaptable to microfabrication below specified width, irrespective of the pressure by using a wide antenna as a single- winding high frequency coil for generating a discharge plasma and feeding a more amt. of gas than the vol. of a discharging chamber above a substrate. SOLUTION: A cylindrical vacuum chamber 1 has a top part made from a disk-like dielectric 2. A magnetic field generating means for forming an annular magnetic neutral line is composed of a small-diameter disk-like or doughnut- like permanent magnet 3 disposed on the top of the dielectric 2 and annular permanent magnet 4 having a larger inner diameter than the magnet 3. A wide antenna disposed between the two magnets 3, 4 forms a single-winding high frequency coil 5 for generating a discharge plasma. An etching gas to be fed is controlled so that its flow rate is 15(±3)×V sccm where the vol. of a reaction chamber is V lit. Thus a reactive dry etching apparatus adaptable to fine machining below 0.3μm width can be realized.
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申请公布号 |
JPH10270422(A) |
申请公布日期 |
1998.10.09 |
申请号 |
JP19970072173 |
申请日期 |
1997.03.25 |
申请人 |
ULVAC JAPAN LTD;HORIIKE YASUHIRO |
发明人 |
HORIIKE YASUHIRO;HAYASHI TOSHIO |
分类号 |
H05H1/46;C23F4/00;H01J37/305;H01L21/205;H01L21/302;H01L21/3065;(IPC1-7):H01L21/306 |
主分类号 |
H05H1/46 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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