发明名称 Testsystem und Testverfahren
摘要 The invention relates to a test system and test method for testing the operatability of test samples (7). A user-specific selection can be made from several prepared test modules (2a-2c), which can be assembled to give the test specification of one's choice. A control module (1) carries out the whole test which corresponds to the user-specific test specification, and directs the individual selected test modules (2a-2c) in accordance with this test specification and in the desired order. Advantageously, a test report is automatically established regarding the test results of the individual selected test modules (2a-2c), which report is particularly incorporated into the user-specific test specification.
申请公布号 DE19713932(A1) 申请公布日期 1998.10.08
申请号 DE19971013932 申请日期 1997.04.04
申请人 OMICRON ELECTRONICS GMBH, ALTACH, AT 发明人 PETER, WINFRIED, HOHENEMS, AT;HENSLER, THOMAS, KLAUS, AT
分类号 G01R31/00;G01R31/327;(IPC1-7):G01R31/00 主分类号 G01R31/00
代理机构 代理人
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