发明名称 |
MEASURING DEVICE WITH ELECTRODES FABRICATED ON POROUS MEMBRANE SUBSTRATE IN WHOLE |
摘要 |
The present invention relates to a measuring device which comprises electrodes fabricated on porous membrane substrate in which the sample migrates chromatographically; and a method for quantifying material in the sample by using the device. The sample material can be quantified by the measuring device, which consists of pretreatment bands in the lower part of the porous membrane substrate and electrodes in the upper part of the pretreatment bands, by the procedure as follows: the sample material is chromatographically migrated in the porous membrane substrate by applying the sample on the lower part of the porous membrane substrate; the changes of the electric signal at the electrode are measured to quantify the material. The analyzing method of this invention has merits; no additional preparation of the sample is needed; a simple and quantitative analysis of the material in short time; economical efficiency because of the dispensability of skilled personnel due to easy manipulation. |
申请公布号 |
WO9844342(A1) |
申请公布日期 |
1998.10.08 |
申请号 |
WO1998KR00064 |
申请日期 |
1998.03.26 |
申请人 |
SAMDUCK INTERNATIONAL CORPORATION;CHA, GEUN-SIG |
发明人 |
CHA, GEUN-SIG |
分类号 |
C12Q1/00;C12Q1/60;G01N27/403;G01N30/28;G01N30/64;G01N30/88 |
主分类号 |
C12Q1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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