发明名称 Method of detecting defects of a structure
摘要 A method of detecting a defect on the surface of a structure using an infrared radiometric thermometer. It is determined that there is a lifting defect at a region of the surface if the region has a temperature difference of 0.3 DEG C. or more in comparison with a surrounding region and has an area of 200 cm2 or more. The temperature of the surface of the structure is obtained using the infrared radiometric thermometer in a period of time from 19:00 p.m. on a day when it is clear at least in the daytime to 4:30 a.m. on the next day.
申请公布号 US5816703(A) 申请公布日期 1998.10.06
申请号 US19960688849 申请日期 1996.07.31
申请人 NITTCO CHEMICAL INDUSTRY CO., LTD. 发明人 YAMAZAKI, KENICHIRO;KAWASE, KIYOTAKA;KOIKE, TOSHIO;HARASHIMA, SUSUMU
分类号 G01N25/72;G01N33/38;(IPC1-7):G01N25/72 主分类号 G01N25/72
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