发明名称 Ultra high density series-connected transistors formed on separate elevational levels
摘要 A three-dimensional integrated circuit and fabrication process is provided for producing active and passive devices on various levels of the integrated circuit. The present process is particularly suited to interconnecting a source of one transistor to a drain of another to form series-connected transistors often employed in core logic units. A junction of an underlying transistor can be connected to a junction of an overlying transistor, with both transistors separated by an interlevel dielectric. The lower transistor junction is connected to the upper level transistor junction using a plug conductor. The plug conductor and, more specifically, the mutually connected junction, is further coupled to a laterally extended interconnect. The interconnect extends from the mutual connection point of the plug conductor to a substrate of the overlying transistor. Accordingly, the source and substrate of the overlying transistor can be connected to a drain of the underlying transistor to not only achieve series-connection but also to connect the source and substrate of an internally configured transistor for the purpose of reducing body effects.
申请公布号 US5818069(A) 申请公布日期 1998.10.06
申请号 US19970879509 申请日期 1997.06.20
申请人 ADVANCED MICRO DEVICES, INC. 发明人 KADOSH, DANIEL;GARDNER, MARK I.
分类号 H01L27/06;(IPC1-7):H01L29/76;H01L31/036;H01L31/112 主分类号 H01L27/06
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