发明名称 Process of making a dram cell arrangement
摘要 For each storage cell, the DRAM cell arrangement has a vertical MOS transistor, the first source/drain region of which is connected to a memory node of a storage capacitor, the channel region of which is annularly enclosed by a gate electrode and the second source/drain region of which is connected to a buried bit line. The DRAM cell arrangement can be produced with a storage-cell area of 4F2 by using only two masks, F being the minimum producible structure size in the respective technology.
申请公布号 US5817552(A) 申请公布日期 1998.10.06
申请号 US19960635526 申请日期 1996.04.22
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 ROESNER, WOLFGANG;RISCH, LOTHAR;HOFMAN, FRANZ;KRAUTSCHNEIDER, WOLFGANG
分类号 H01L21/8242;H01L27/108;(IPC1-7):H01L21/824 主分类号 H01L21/8242
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