发明名称 |
Process of making a dram cell arrangement |
摘要 |
For each storage cell, the DRAM cell arrangement has a vertical MOS transistor, the first source/drain region of which is connected to a memory node of a storage capacitor, the channel region of which is annularly enclosed by a gate electrode and the second source/drain region of which is connected to a buried bit line. The DRAM cell arrangement can be produced with a storage-cell area of 4F2 by using only two masks, F being the minimum producible structure size in the respective technology.
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申请公布号 |
US5817552(A) |
申请公布日期 |
1998.10.06 |
申请号 |
US19960635526 |
申请日期 |
1996.04.22 |
申请人 |
SIEMENS AKTIENGESELLSCHAFT |
发明人 |
ROESNER, WOLFGANG;RISCH, LOTHAR;HOFMAN, FRANZ;KRAUTSCHNEIDER, WOLFGANG |
分类号 |
H01L21/8242;H01L27/108;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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