发明名称 CLEARANCE MEASURING DEVICE FOR SEMISPHERICAL DYNAMIC PRESSURE BEARING
摘要 <p>PROBLEM TO BE SOLVED: To easily measure the clearance between semispheres and semispherical grooves in a short time by vertically moving the semispheres and a connecting shaft, and measuring their shift distances. SOLUTION: When a tapered shaft 50 is rotated, a taper section 52 is advanced while being kept in contact with the lower side face of a lift hole 42, and the lower side face of the lift hole 42 is moved downward along the face of the taper section 52, i.e., an adjusting shaft 40 is moved downward. Semispheres 5, 6 and a connecting shaft 8 are moved downward. The upper semisphere 5 and an upper semispherical groove 2 are kept in contact with each other, and the lower semisphere 6 and a lower semispherical groove 3 are separated from each other. The heights of the semispheres 5, 6 and the connecting shaft 8 from the lower end face of a main body 10 or the other prescribed reference line before and after the movement are measured with a height measuring mechanism, the heights after movement are subtracted from the heights before movement, then the sums of the clearance distances between the upper and lower semispheres 5, 6 and the semispherical grooves 2, 3 corresponding to them are obtained. When the sums are halved, the clearance distances between the semispheres 5, 6 and the semispherical grooves 2, 3 are obtained.</p>
申请公布号 JPH10260001(A) 申请公布日期 1998.09.29
申请号 JP19970312423 申请日期 1997.11.13
申请人 SAMSUNG ELECTRON CO LTD 发明人 SAI SHINSHO
分类号 G01B5/14;F16C17/10;(IPC1-7):G01B5/14 主分类号 G01B5/14
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