| 摘要 |
An integrated circuit device equipped with a test circuit includes a plurality of input/output terminals, an input terminal, and an internal circuit for receiving input data via the plurality of input/output terminals and outputting output data. The test circuit permits data exchange among the input/output terminals, the input terminal and the internal circuit. The test circuit preferably operates in a normal mode to supply input data to the internal circuit through the input/output terminals, and supply output data from the internal circuit through the input/output terminals. The test circuit further operates in a test mode to supply test input data to the internal circuit through one of the input terminal and the input/output terminals. The test circuit further supplies test output data that is output from the internal circuit to one of the input terminal and the input/output terminals which differ from the test input data supplied terminal.
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