发明名称 Transmission mask for charged particle beam exposure apparatuses, and an exposure apparatus using such a transmission mask
摘要 A transmission mask for a charged particle beam exposure apparatus that includes a mask substrate having a plurality of apertures arrange in a matrix and a pair of deflection electrodes at each aperture on one surface of the mask substrate. A beam shield layer having a reflectivity to the charged particle beam greater than the mask substrate is positioned on the other surface of the mask substrate. The transmission mask is installed in the apparatus so that the beam shield layer is oriented towards the charged particle beam to prevent an increase in temperature due to irradiation of the charged particle beam.
申请公布号 US5814423(A) 申请公布日期 1998.09.29
申请号 US19960739962 申请日期 1996.10.30
申请人 FUJITSU LIMITED 发明人 MARUYAMA, SHIGERU;YASUDA, HIROSHI;OOAEH, YOSHIHISA
分类号 H01J37/305;H01L21/027;(IPC1-7):G03F9/00 主分类号 H01J37/305
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