发明名称 IN-CIRCUIT TESTER
摘要 PROBLEM TO BE SOLVED: To obtain an in-circuit tester for performing test by moving a probe pin based on an NC data in which a printed board can be tested in safety without requiring any manual confirmation of a test program by providing an improved mechanism for preventing interference of component. SOLUTION: A distance measuring sensor 2 having a mechanism being moved for scanning in the horizontal direction through an X-Y biaxial robot 3 is disposed above a printed board 1 fixed to a printed board guide block 7 and irregularities are detected on the entire surface of the printed board 1 through two-dimensional scanning of the sensor 2. A region mounted with a component is discriminated from a region mounted with no component based on a component mounting position data and presence of a component 10 mounted on the lowering track of a probe pin 5 is detected. Subsequently, a probe pin fixing unit 4 which does not interfere with the mounted component 10 is selected automatically for a test point 9 and a test is performed by lowering the probe pin 5.
申请公布号 JPH10253716(A) 申请公布日期 1998.09.25
申请号 JP19970059080 申请日期 1997.03.13
申请人 HITACHI LTD 发明人 HARIKAE KOUJIN;SUGAWARA SADAYUKI;HORII TOMOHARU;KASAISHI MITSURU
分类号 G01R1/06;G01R31/02;G01R31/28;H05K13/08 主分类号 G01R1/06
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