发明名称 |
METHOD OF CLEANING PROBE FOR ELECTRICALLY INSPECTING BOARD, AND CLEANING APPARATUS AND TOOL THEREOF |
摘要 |
PROBLEM TO BE SOLVED: To perform surely with only one cleaning work the cleaning of the contamination matters stuck on the end portion of the contact pin of a probe for inspecting electrically boards which is used in an equipment for board testings including an in-circuit testing. SOLUTION: For cleaning a probe 4 for inspecting electrically boards, which is used in an equipment for board testings including an in-circuit testing, the end portion of a contact pin 5 of the probe 4 for inspecting electrically boards is stuck into an elastic body sheet 1 molded by distributing therein fine metal oxides 2 of a predetermined wt.%. Thereby, the contamination matters including solder fluxes F stuck on the end portion are captured surely in the elastic body sheet 1. |
申请公布号 |
JPH10256709(A) |
申请公布日期 |
1998.09.25 |
申请号 |
JP19970055110 |
申请日期 |
1997.03.10 |
申请人 |
CANON INC |
发明人 |
KITANI MITSUJI;KIKUCHI SHIGEO;SATOMI KUNIO |
分类号 |
G01R1/06;G01R3/00;G01R31/02;G01R31/28;H05K3/26;H05K13/08 |
主分类号 |
G01R1/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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