发明名称 METHOD OF CLEANING PROBE FOR ELECTRICALLY INSPECTING BOARD, AND CLEANING APPARATUS AND TOOL THEREOF
摘要 PROBLEM TO BE SOLVED: To perform surely with only one cleaning work the cleaning of the contamination matters stuck on the end portion of the contact pin of a probe for inspecting electrically boards which is used in an equipment for board testings including an in-circuit testing. SOLUTION: For cleaning a probe 4 for inspecting electrically boards, which is used in an equipment for board testings including an in-circuit testing, the end portion of a contact pin 5 of the probe 4 for inspecting electrically boards is stuck into an elastic body sheet 1 molded by distributing therein fine metal oxides 2 of a predetermined wt.%. Thereby, the contamination matters including solder fluxes F stuck on the end portion are captured surely in the elastic body sheet 1.
申请公布号 JPH10256709(A) 申请公布日期 1998.09.25
申请号 JP19970055110 申请日期 1997.03.10
申请人 CANON INC 发明人 KITANI MITSUJI;KIKUCHI SHIGEO;SATOMI KUNIO
分类号 G01R1/06;G01R3/00;G01R31/02;G01R31/28;H05K3/26;H05K13/08 主分类号 G01R1/06
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