| 摘要 |
PROBLEM TO BE SOLVED: To increase the communication function of an integrated circuit without increasing the number of pins by allowing a test access port(TAP) controller to execute a series test data communication under the control of a clock signal. SOLUTION: In a first operation mode, a TAP controller 4 is connected to a test logic, and a series test data communication exceeding a chip boundary is executed under the control of a clock signal to be inputted. In a second operation mode, a data adapter is connected to input and output pins via the TAP controller 4, and parallel data and a control signal are supplied from an on-chip function circuit. The parallel data and the control signal are converted to a series of serial bits with flow-control bits and data bits for performing on-chip communication via the TAP controller 4 under the control of the clock signal. Further, the serial bits are converted to parallel data and a control signal for the on-chip function circuit. |
