发明名称 |
Method of controlled etching in the manufacture of a color selection mask for a color cathode ray tube |
摘要 |
A method of forming a pattern of electron-transmissive apertures in a color selection mask for a color cathode ray tube. The method includes providing an electrically conductive preformed blank comprising a relatively thin aperture-defining layer on a relatively thick substrate layer; establishing a first etchant-resistant structure on the aperture-defining layer; etching through the blank to form preliminary sized and shaped apertures in the aperture-defining layer; establishing a second etchant-resistant structure on the aperture-defining layer; etching the aperture-defining layer forming ultimate apertures in the aperture-defining layer; and stripping the etchant-resistant structure from the aperture-defining layer.
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申请公布号 |
US3993516(A) |
申请公布日期 |
1976.11.23 |
申请号 |
US19740512583 |
申请日期 |
1974.10.07 |
申请人 |
ZENITH RADIO CORPORATION |
发明人 |
PRAZAK,III, CHARLES J.;STACHNIAK, RAYMOND M. |
分类号 |
H01J9/14;(IPC1-7):H01J9/20 |
主分类号 |
H01J9/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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