发明名称 CHEMICAL AMPLIFICATION TYPE RESIST
摘要 PROBLEM TO BE SOLVED: To suppress the formation of a slightly soluble surface layer in a resist due to the deactivation of an acid and to prevent the formation of a T-shaped resist pattern after development by using polyhydroxystyrene resin obtd. by mixing polyhydroxystyrene resins hating the same protective groups or mutually different protective groups and different from each other in average mol.wt. SOLUTION: This chemical amplification type resist contains polyhydroxystyrene resin having protective groups whose polarity varies in the presence of an acid catalyst and a photo-acid generating agent. The resin is obtd. by mixing polyhydroxystyrene resins having the same protective groups or mutually different protective groups and different from each other in average mol.wt. The protected polyhydroxystyrene resins have relatively high average mol.wt. and relatively low average mol.wt. This resist has improved resolution because of a higher solution velocity of the unexposed part and a higher gradient of solubility known from the relation between the solution velocity of the resist to a developer and exposure.
申请公布号 JPH10254138(A) 申请公布日期 1998.09.25
申请号 JP19970059150 申请日期 1997.03.13
申请人 NEC CORP 发明人 ITANI TOSHIRO
分类号 C08F12/22;C08L25/18;G03F7/00;G03F7/039;H01L21/027;(IPC1-7):G03F7/039 主分类号 C08F12/22
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