Integrierte Schaltung mit einem Speicher und einer Prüfschaltung

摘要

According to the invention, the memory (2) can be controlled by a control circuit (3) and connected thereto via data lines (D1, D2), address lines (ADR) and control lines (RAS, CAS, OE), at least one of which travels through a switching device. Said switching device (L, G) can be controlled via an external connection (6, 7) of the integrated circuit (1), whereby the signal traveling through the corresponding line and the appropriate control time can be influenced. The invention is particularly suitable for carrying out self-testing on integrated memory cores.