发明名称 METHOD AND APPARATUS FOR MEASURING PROPERTIES AND PROCESSES OF CELLS AT SURFACES
摘要 <p>By a method for measuring in real time properties and/or processes of one or more cells interacting with at least one surface of at least one piezoelectric crystal sensor (1), where one side of the crystal sensor forms a sensor surface, which is exposed to a liquid, containing the cells, the damping of the crystal sensor is measured during and/or after one or more cells are brought into contact with the sensor surface. An apparatus for such a measurement includes at least one piezoelectric crystal sensor (1) with crystal and drive circuit to put the crystal in oscillation and a device to expose one side of the crystal to a liquid, containing the cells. A measuring unit is arranged to measure the damping of the crystal and/or changes in the damping during the interaction of the cells with the crystal surface.</p>
申请公布号 WO1998041820(A1) 申请公布日期 1998.09.24
申请号 SE1998000485 申请日期 1998.03.17
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