发明名称 Double word line decoder circuit for DRAM memory cells
摘要 The circuit includes numerous lower word lines (SWL), associated with several memory cells (Cell 1.1 - Cell 4.N), that each have a driver (34A,B) energised by a signal (RA1,2) for energising an allocated pair of main word lines (MWL,MWLB). A decoder (31,32) transmits the lower word line energising signal to the driver at a specified level. The level concerns an earth voltage (VSS) and a first raised voltage level (VPP2), higher than a positive power supply voltage level (VDD) according to an applied, inverted precharge signal (PCB) and applied first address signal (AX5,6), and changes accordingly. A main word line energiser (33) energises the first word line of the pair according to specified criteria, while the second main word line is energised, depending on stated conditions.
申请公布号 DE19800344(A1) 申请公布日期 1998.09.24
申请号 DE19981000344 申请日期 1998.01.07
申请人 LG SEMICON CO., LTD., CHEONGJU, KR 发明人 LEE, SANG-HO, CHOONGCHEONGBUK, KR;SIM, JAE-KWANG, CHOONGCHEONGBUK, KR
分类号 G11C11/413;G11C8/10;G11C8/12;G11C11/407;(IPC1-7):G11C8/00 主分类号 G11C11/413
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