发明名称 |
Double word line decoder circuit for DRAM memory cells |
摘要 |
The circuit includes numerous lower word lines (SWL), associated with several memory cells (Cell 1.1 - Cell 4.N), that each have a driver (34A,B) energised by a signal (RA1,2) for energising an allocated pair of main word lines (MWL,MWLB). A decoder (31,32) transmits the lower word line energising signal to the driver at a specified level. The level concerns an earth voltage (VSS) and a first raised voltage level (VPP2), higher than a positive power supply voltage level (VDD) according to an applied, inverted precharge signal (PCB) and applied first address signal (AX5,6), and changes accordingly. A main word line energiser (33) energises the first word line of the pair according to specified criteria, while the second main word line is energised, depending on stated conditions.
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申请公布号 |
DE19800344(A1) |
申请公布日期 |
1998.09.24 |
申请号 |
DE19981000344 |
申请日期 |
1998.01.07 |
申请人 |
LG SEMICON CO., LTD., CHEONGJU, KR |
发明人 |
LEE, SANG-HO, CHOONGCHEONGBUK, KR;SIM, JAE-KWANG, CHOONGCHEONGBUK, KR |
分类号 |
G11C11/413;G11C8/10;G11C8/12;G11C11/407;(IPC1-7):G11C8/00 |
主分类号 |
G11C11/413 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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