| 摘要 |
PCT No. PCT/NL95/00033 Sec. 371 Date Aug. 12, 1996 Sec. 102(e) Date Aug. 12, 1996 PCT Filed Jan. 24, 1995 PCT Pub. No. WO95/20242 PCT Pub. Date Jul. 27, 1995Electron microscope provided, in the direction of the longitudinal axis, with at least one electron beam generation system, a condenser and objective lens system, a specimen chamber with a specimen mount, a projection lens system with imaging screen for the purpose of transmission electron microscopy (TEM) and/or an electron detector for the purpose of scanning electron microscopy (SEM) . The microscope is used in combination with an externally positioned Raman spectrometer and an associated light source for injecting and extracting, via a window in the microscope wall, a light beam to be directed at the specimen, and specimen-related Raman radiation, respectively. In the specimen chamber, a light beam and Raman radiation guide system is provided with an optical guide to guide the light beam to-and the Raman radiation from-the specimen. The guide system and the specimen mount are displaceable with respect to one another for mutual alignment of the specimen and the optical axis of the Raman spectrometer.
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