发明名称 Verfahren zur Überwachung der Produktion von Flachmaterial mittels eines im nahen Infrarot arbeitenden Spektrometers und Vorrichtung zur Durchführung dieses Verfahrens
摘要 The invention relates to a method for monitoring the production of flat material (20) by means of a spectrometer (42) operating in the near-infrared range, said flat material (20) being transported in its longitudinal direction (22). A transverse bar (26) is positioned at a distance from the flat material (20), which transverse bar runs perpendicular to the longitudinal direction (22) and in which is arranged a large number of optic fibres (28). The first end area of these fibres is directed towards the flat material (20) in such a way that said end area captures the reflected light along a track (30) assigned to each end area, and that the optic fibres (28) transmit the detected light to a commutator (32) in which the second end areas of the individual optic fibres (28) are distributed uniformly and parallel to each other across an arc of a circle, in an order which does not correspond to the order of the tracks (30). In said commutator (32), a transfer fibre (40) which guides the light to the spectrometer (42) is arranged on a turning arm (36) which turns around the centre of the arc of circle and in this way brings the transfer fibre (40) into optical contact with one individual optic fibre (28) after another.
申请公布号 DE19709963(A1) 申请公布日期 1998.09.17
申请号 DE1997109963 申请日期 1997.03.11
申请人 QUALICO GMBH, 52428 JUELICH, DE 发明人 STRAEMKE, SIEGFRIED, DR., 52538 SELFKANT, DE;SCHUMACHER, URSULA, DR., 52428 JUELICH, DE;ISCHDONAT, THOMAS, 52070 AACHEN, DE
分类号 G01N21/89;G01N21/359;G01N21/86;G02B6/35;(IPC1-7):G01N21/25;G01J3/42;G01J3/30 主分类号 G01N21/89
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