发明名称 Multiple-metal-level integrated device and fabrication process thereof
摘要 An integrated device (1) comprising two metal levels (6, 8) separated by a layer of insulating material (3) and connected (10) electrically at respective contact pads (5, 7) located one over the other. The two pads (5, 7) are connected electrically by a number of parallel contact regions (10) having a much smaller cross sectional area as compared with the contact pads (5, 7). The contact regions (10) are so formed as to terminate close to the side of the lower contact pad (5) from which a respective metal line (4) extends, and are covered by the final passivation layer (12). <IMAGE> <IMAGE>
申请公布号 EP0631314(B1) 申请公布日期 1998.09.16
申请号 EP19930830277 申请日期 1993.06.28
申请人 STMICROELECTRONICS S.R.L. 发明人 CAPRILE, CANDIDA;DE SANTI, GIORGIO
分类号 H05K3/46;H01L23/12;H01L23/485;H01L23/522 主分类号 H05K3/46
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