| 发明名称 |
Semiconductor probe card for low current measurements |
| 摘要 |
A semiconductor probe card is provided with low dielectric absorption feed-through contacts to isolate test lines from printed circuit board leakage effects.
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| 申请公布号 |
US5808475(A) |
申请公布日期 |
1998.09.15 |
| 申请号 |
US19960660441 |
申请日期 |
1996.06.07 |
| 申请人 |
KEITHLEY INSTRUMENTS, INC. |
发明人 |
KNAUER, WILLIAM;BENNETT, ROBERT |
| 分类号 |
G01R1/04;G01R1/073;(IPC1-7):G01R1/04 |
主分类号 |
G01R1/04 |
| 代理机构 |
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代理人 |
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