发明名称 Scanning near-field optical microscope
摘要 <p>An optical waveguide probe 1 provided with a microscopic aperture portion of a diameter less than a wavelength at its tip, a vibration application portion consisting of a piezoelectric vibrating body 2 and an AC voltage-generating portion 3, a vibration-detecting means consisting of a quartz oscillator 4 and a current/voltage amplifier circuit 5, a coarse displacement means 6 for bringing the optical waveguide probe close to a surface of a sample, an optical detection means consisting of lenses 7, 8 and a photodetector 9, a sample-to-probe distance control means consisting of a Z motion fine adjustment device 11 and a Z servo circuit 12, a two-dimensional scanning means consisting of an XY fine motion device 13 and an XY scanning circuit 14, and a data processing means 15 for converting a measurement signal into a three-dimensional image. The optical waveguide probe 1 is preferably held to the quartz oscillator 4 by spring pressure of a resilient body 16. <IMAGE></p>
申请公布号 EP0864899(A2) 申请公布日期 1998.09.16
申请号 EP19980301808 申请日期 1998.03.11
申请人 SEIKO INSTRUMENTS INC. 发明人 TOMITA, EISUKE
分类号 G01B11/30;G01N37/00;G01Q10/02;G01Q20/04;G01Q30/02;G01Q30/08;G01Q30/10;G01Q30/20;G01Q60/18;G01Q70/02;(IPC1-7):G02B21/00 主分类号 G01B11/30
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