发明名称 METHOD FOR MEASURING SURFACE IMIDE DERIVED RATE OF POLYIMIDE
摘要 <p>PROBLEM TO BE SOLVED: To provide a method for measuring a polyimide film and imide derived rate of surfaces of the film. SOLUTION: The method for measuring surface imide derived rate of a polyimide comprises the steps of measuring the polyimide by an X-ray photoelectron spectroscopy(XPS), waveform separating Cls spectra into a peak of carbon in amide bond, a peak of carbon in carboxyl group and a peak of carbon of imidocarbonyl, and measuring the surface imide derived rate of the polyimide by next formula. formula: r=[CO-N-CO]/ [CO-N-CO]+[CON]+[COOH]}/2. In the formula, r indicates imide derived rate, [CO-N-CO] indicates peak area ratio of carbon of imidocarbonyl of Cls spectrum, [COOH] indicates peak area ratio of carbon in carboxyl group of Cls.</p>
申请公布号 JPH10246711(A) 申请公布日期 1998.09.14
申请号 JP19970050468 申请日期 1997.03.05
申请人 SUMITOMO BAKELITE CO LTD 发明人 EGUCHI TOSHIMASA;ISHIGURO TOSHIHISA
分类号 G01N23/227;C08G73/10;(IPC1-7):G01N23/227 主分类号 G01N23/227
代理机构 代理人
主权项
地址