发明名称 JOHANNSON ANALYZING CRYSTAL
摘要 <p>PROBLEM TO BE SOLVED: To improve the wavelength resolution of an X-ray to be spectrally diffracted and the X-ray intensity to background ratio more than in the past in a Johannson analyzing crystal. SOLUTION: Near the crystal surface 8 of a Johannson analyzing crystal, incident X-ray limiting plates 11 consisting of a material not transmitting X-ray are arranged. The incident X-ray limiting plates 11 are manually or automatically opened and closed symmetrically in the crystal width direction with the central circular arch of this Johannson analyzing crystal as the center so that the space between the incident X-ray limiting plates can be regulated by a suitable driving mechanism. Thus, it can be limited by the incident X-ray limiting plates 11 that an X-ray having a wavelength differed from the X-ray having a wavelength in which the incident angleθon the spectral center O becomes Bragg angleθB is incident on the crystal surface, and the wavelength resolution of the X-ray to be spectrally diffracted and the X-ray intensity to background ratio can be improved.</p>
申请公布号 JPH10239495(A) 申请公布日期 1998.09.11
申请号 JP19970042029 申请日期 1997.02.26
申请人 JEOL LTD 发明人 KAWABE KAZUYASU
分类号 G01N23/225;G21K1/06;H01J37/252;(IPC1-7):G21K1/06 主分类号 G01N23/225
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