发明名称 SILHOUETTE IMAGE PICK-UP METHOD AND DEVICE AND OBJECT INSPECTION METHOD AND DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide an X-ray inspection device for judging whether the inside of an object is normal or not based on a silhouette image by obtaining a clear silhouette image due to X rays even for an object whose internal shape is complex. SOLUTION: An object S is placed on a placement stand (XY table) 3, and an X-ray source 1 for emitting X rays and an X-ray detector 2 for detecting X rays are arranged at opposite positions with the object S in between. In this case, while the X-ray source 1 and the X-ray detector 2 are positioned in opposite directions with the object S as a center, the X-ray source 1 and the X-ray detector 2 are moved in one piece within each conical region with an area near the object S as a top position, X rays are projected to the object S from the X-ray source 1, and X rays through the object S are detected by the X-ray detector 2 and the silhouette image of the object S is displayed on a monitor device 9.</p>
申请公布号 JPH10239253(A) 申请公布日期 1998.09.11
申请号 JP19970045445 申请日期 1997.02.28
申请人 TECHNO ENAMI:KK 发明人 TERAOKA AKIRA
分类号 G01N23/04;G03B42/02;(IPC1-7):G01N23/04 主分类号 G01N23/04
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