发明名称 |
REGRESSION CALIBRATED SPECTROSCOPIC ROTATING COMPENSATOR ELLIPSOMETER SYSTEM WITH PHOTO ARRAY DETECTOR |
摘要 |
A spectroscopic rotating compensator material system investigation system including a photo array (DE's) for simultaneously detecting a multiplicity of wavelengths is disclosed. The spectroscopic rotating compensator material system investigation system is calibrated by a mathematical regression based technique involving, where desirable, parameterization of calibration parameters. Calibration is possible of calibration parameters. Calibration is possible utilizing a single two-dimensional data set obtained with the spectroscopic rotating compensator material system investigation system in a "material system present" or in a "straight-through" configuration.
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申请公布号 |
WO9839633(A1) |
申请公布日期 |
1998.09.11 |
申请号 |
WO1998US02390 |
申请日期 |
1998.02.02 |
申请人 |
J.A. WOOLLAM COMPANY INCORPORATED |
发明人 |
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分类号 |
G01J3/28;G01J3/447;G01J4/00;G01N21/21;(IPC1-7):G01N21/21 |
主分类号 |
G01J3/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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