发明名称 STANDARD FOR CALIBRATING AND CHECKING A SURFACE INSPECTION DEVICE AND METHOD FOR THE PRODUCTION THEREOF
摘要 The invention relates to a reproducible standard for calibrating and checking the bright-field channel of a surface inspection device used for examining the flat surface of a sample and to a method for producing said standard whereby a microstructure is produced on a surface of a substrate provided as a standard, characterized in that the microstructure is smoothed out.
申请公布号 WO9839638(A1) 申请公布日期 1998.09.11
申请号 WO1998EP01313 申请日期 1998.03.06
申请人 WACKER SILTRONIC GESELLSCHAFT FUER HALBLEITERMATERIALIEN AG;SCHMOLKE, RUEDIGER;GERBER, HANS-ADOLF;GRAEF, DIETER;KERSCHREITER, ROBERT;LUGER, ANTON;SUHREN, MONIQUE 发明人 SCHMOLKE, RUEDIGER;GERBER, HANS-ADOLF;GRAEF, DIETER;KERSCHREITER, ROBERT;LUGER, ANTON;SUHREN, MONIQUE
分类号 G01B11/30;G01N21/93;H01L21/306;H01L21/66 主分类号 G01B11/30
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