发明名称 SRAM P-CHANNEL MOS TRANSISTOR SELF-ALIGNED OFFSET STRUCTURE
摘要 PROBLEM TO BE SOLVED: To provide an SRAM p-channel MOS transistor self-aligned offset structure which reduces the leakage current of pMOS transistor memory cells. SOLUTION: A p-channel MOS transistor has a gate electrode 30, a source electrode 31 and a drain electrode 32 formed on a semiconductor substrate and is used as a load of an SRAM cell. A high-resistance offset 28 is provided between the drain and the source electrodes 32, 31 and directly formed on the gate electrode 30 between these electrodes 32, 31 during a process of a photo mask for the gate electrode 30, without using an extra manufacturing step and photo mask.
申请公布号 JPH10242302(A) 申请公布日期 1998.09.11
申请号 JP19970057175 申请日期 1997.02.26
申请人 TAIWAN MOSHII DENSHI KOFUN YUGENKOSHI 发明人 GO KOKA;KO EISEI;CHO TORYU
分类号 H01L27/092;H01L21/336;H01L21/8238;H01L21/8244;H01L27/11;H01L29/786 主分类号 H01L27/092
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