发明名称 |
SRAM P-CHANNEL MOS TRANSISTOR SELF-ALIGNED OFFSET STRUCTURE |
摘要 |
PROBLEM TO BE SOLVED: To provide an SRAM p-channel MOS transistor self-aligned offset structure which reduces the leakage current of pMOS transistor memory cells. SOLUTION: A p-channel MOS transistor has a gate electrode 30, a source electrode 31 and a drain electrode 32 formed on a semiconductor substrate and is used as a load of an SRAM cell. A high-resistance offset 28 is provided between the drain and the source electrodes 32, 31 and directly formed on the gate electrode 30 between these electrodes 32, 31 during a process of a photo mask for the gate electrode 30, without using an extra manufacturing step and photo mask. |
申请公布号 |
JPH10242302(A) |
申请公布日期 |
1998.09.11 |
申请号 |
JP19970057175 |
申请日期 |
1997.02.26 |
申请人 |
TAIWAN MOSHII DENSHI KOFUN YUGENKOSHI |
发明人 |
GO KOKA;KO EISEI;CHO TORYU |
分类号 |
H01L27/092;H01L21/336;H01L21/8238;H01L21/8244;H01L27/11;H01L29/786 |
主分类号 |
H01L27/092 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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