发明名称 Static type semiconductor memory device with timer circuit
摘要 <p>In a static type semiconductor memory device, a word decoder (13) is connected to a plurality of word lines to decode an address signal to select one of the plurality of word lines. A resistor load type memory cell (10) is connected to said selected word line. The resistor load type memory cell is composed of two pairs of a load resistor and a MOS transistor and the two pairs are connected to form a flip-flop. A word line voltage boosting circuit (12) is connected to the word decoder to boost a voltage of the selected word line to a voltage higher than a power supply voltage in response to a boost control signal. A timer circuit (11) includes a replica of the load transistor of one of the two pair and replicas of the MOS transistors of the two pair. The timer circuit generates the boost control signal for a predetermined time period in response to a start control signal to activate said word line voltage boosting circuit. &lt;IMAGE&gt;</p>
申请公布号 EP0862181(A2) 申请公布日期 1998.09.02
申请号 EP19980102345 申请日期 1998.02.11
申请人 NEC CORPORATION 发明人 INABA, HIDEO
分类号 G11C11/413;G11C8/08;G11C8/10;G11C8/18;G11C11/18;G11C11/418;(IPC1-7):G11C11/418;G11C8/00 主分类号 G11C11/413
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