发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To enable annealing in an atmosphere containing halogen elements without deteriorating a channel doping effect. SOLUTION: A catalyst element for promoting crystallization is added to an amorphous silicon film containing impurity elements for threshold control, and the film is annealed to form a crystalline silicon film. Next, the film is annealed in an atmosphere containing halogen elements to subject catalyst elements to a gettering process. At this time, a compound gas containing impurity elements for threshold control is mixed into the atmosphere, whereby a chemically balanced state can be established for the impurity elements, thus preventing the impurity elements from moving into a gaseous phase.
申请公布号 JPH10233363(A) 申请公布日期 1998.09.02
申请号 JP19970051087 申请日期 1997.02.19
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI;OTANI HISASHI
分类号 H01L21/205;G02F1/1362;H01L21/20;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/786;(IPC1-7):H01L21/20 主分类号 H01L21/205
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