发明名称 |
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To enable annealing in an atmosphere containing halogen elements without deteriorating a channel doping effect. SOLUTION: A catalyst element for promoting crystallization is added to an amorphous silicon film containing impurity elements for threshold control, and the film is annealed to form a crystalline silicon film. Next, the film is annealed in an atmosphere containing halogen elements to subject catalyst elements to a gettering process. At this time, a compound gas containing impurity elements for threshold control is mixed into the atmosphere, whereby a chemically balanced state can be established for the impurity elements, thus preventing the impurity elements from moving into a gaseous phase. |
申请公布号 |
JPH10233363(A) |
申请公布日期 |
1998.09.02 |
申请号 |
JP19970051087 |
申请日期 |
1997.02.19 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
YAMAZAKI SHUNPEI;OTANI HISASHI |
分类号 |
H01L21/205;G02F1/1362;H01L21/20;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/786;(IPC1-7):H01L21/20 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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