发明名称 Ion implantation process simulation device realizing accurate interpolation of ion implatation profiles and simulation method therefor
摘要 <p>An ion implantation process simulation device including a Dual Pearson data extracting unit (10) for generating a Dual Pearson data table (11) from ion implantation profile data, a Dual Pearson data for interpolation obtaining unit (20) for obtaining a parameter for use in the interpolation and extrapolation of a dose coefficient from the Dual Pearson data table (11), a dose coefficient interpolating/extrapolating unit (30) for expressing an ion implantation profile by linear connection of two functions respectively representing an amorphous component and a channeling component, as well as using a dose-independent moment parameter and a coefficient of linear connection dependent on dose to interpolate and extrapolate a logarithmic value of a channeling component dose coefficient with respect to logarithmic values of all dose values, and a simulation result outputting unit (40) for outputting a simulation result. &lt;IMAGE&gt;</p>
申请公布号 EP0862126(A2) 申请公布日期 1998.09.02
申请号 EP19980103392 申请日期 1998.02.26
申请人 NEC CORPORATION 发明人 ASADA, SUSUMU;SAWAHATA, KOICHI
分类号 H01L21/265;G06F17/50;H01L21/00;(IPC1-7):G06F17/50 主分类号 H01L21/265
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