发明名称 |
Ion implantation process simulation device realizing accurate interpolation of ion implatation profiles and simulation method therefor |
摘要 |
<p>An ion implantation process simulation device including a Dual Pearson data extracting unit (10) for generating a Dual Pearson data table (11) from ion implantation profile data, a Dual Pearson data for interpolation obtaining unit (20) for obtaining a parameter for use in the interpolation and extrapolation of a dose coefficient from the Dual Pearson data table (11), a dose coefficient interpolating/extrapolating unit (30) for expressing an ion implantation profile by linear connection of two functions respectively representing an amorphous component and a channeling component, as well as using a dose-independent moment parameter and a coefficient of linear connection dependent on dose to interpolate and extrapolate a logarithmic value of a channeling component dose coefficient with respect to logarithmic values of all dose values, and a simulation result outputting unit (40) for outputting a simulation result. <IMAGE></p> |
申请公布号 |
EP0862126(A2) |
申请公布日期 |
1998.09.02 |
申请号 |
EP19980103392 |
申请日期 |
1998.02.26 |
申请人 |
NEC CORPORATION |
发明人 |
ASADA, SUSUMU;SAWAHATA, KOICHI |
分类号 |
H01L21/265;G06F17/50;H01L21/00;(IPC1-7):G06F17/50 |
主分类号 |
H01L21/265 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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