发明名称 |
Spring probe and method for biasing |
摘要 |
A spring-loaded contact probe for performing tests on an electrical device. The probe includes an elongated plunger having an end with a convex surface retained within a barrel. A spring for applying an axial load is positioned within the barrel and a ball sized to translate a portion of the axial force into a side loading force is positioned between the spring and the convex surface of the plunger. The spring has a tightly wound coil adjacent the ball for maintaining the ball against the barrel.
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申请公布号 |
US5801544(A) |
申请公布日期 |
1998.09.01 |
申请号 |
US19970783467 |
申请日期 |
1997.01.16 |
申请人 |
DELAWARE CAPITAL FORMATION, INC. |
发明人 |
SWART, MARK A.;VINTHER, GORDON A. |
分类号 |
G01R1/067;(IPC1-7):G01R31/02 |
主分类号 |
G01R1/067 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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