发明名称 |
Method of manufacturing semiconductor wafers |
摘要 |
A method of manufacturing semiconductor wafers includes a double side primary polishing step, a back side etching step and a single side mirror polishing step. This method is capable of easy sensor detection of the front and back sides of the wafer, wafer processing of higher flatness level by forming etched rough surface at the back side of the double side polished wafer and setting up of wafer manufacturing process including a double side polishing step.
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申请公布号 |
US5800725(A) |
申请公布日期 |
1998.09.01 |
申请号 |
US19970789798 |
申请日期 |
1997.01.28 |
申请人 |
SHIN-ETSU HANDOTAI CO., LTD. |
发明人 |
KATO, TADAHIRO;MASUMURA, HISASHI;KUDO, HIDEO |
分类号 |
H01L21/306;H01L21/302;H01L21/304;(IPC1-7):B44C1/22;C03C15/00 |
主分类号 |
H01L21/306 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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