发明名称 Method of manufacturing semiconductor wafers
摘要 A method of manufacturing semiconductor wafers includes a double side primary polishing step, a back side etching step and a single side mirror polishing step. This method is capable of easy sensor detection of the front and back sides of the wafer, wafer processing of higher flatness level by forming etched rough surface at the back side of the double side polished wafer and setting up of wafer manufacturing process including a double side polishing step.
申请公布号 US5800725(A) 申请公布日期 1998.09.01
申请号 US19970789798 申请日期 1997.01.28
申请人 SHIN-ETSU HANDOTAI CO., LTD. 发明人 KATO, TADAHIRO;MASUMURA, HISASHI;KUDO, HIDEO
分类号 H01L21/306;H01L21/302;H01L21/304;(IPC1-7):B44C1/22;C03C15/00 主分类号 H01L21/306
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