发明名称 Method of forming metal wirings on a semiconductor substrate by dry etching
摘要 Disclosed herein is, a method of forming a metal wiring on a semiconductor substrate dry etching a metal wiring film or a laminated structure film comprising a metal wiring film and a metal barrier film, which includes a first step of performing etching to a metal wiring film and a second dry etching step of overetching the metal wiring film or the metal barrier film under such a condition that the residence time of a gas in an etching chamber in the second dry etching step is shorter than a residence time of a gas in the first etching step.
申请公布号 US5801101(A) 申请公布日期 1998.09.01
申请号 US19960689248 申请日期 1996.08.07
申请人 NEC CORPORATION 发明人 MIYOSHI, KOUSUKE
分类号 H01L21/302;H01L21/3065;H01L21/3205;H01L21/3213;H01L23/52;(IPC1-7):H01L21/306 主分类号 H01L21/302
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