The method involves supplying a reference signal at the analogous input of the A/D converter for the implementation of a test cycle, comparing the digitized reference signal with a nominal signal and recognizing the A/D converter as defective at a deviation.
申请公布号
DE19705406(A1)
申请公布日期
1998.08.27
申请号
DE19971005406
申请日期
1997.02.13
申请人
TEMIC TELEFUNKEN MICROELECTRONIC GMBH, 74072 HEILBRONN, DE