| 发明名称 |
SEMICONDUCTOR TESTER WITH DATA SERIALIZER |
| 摘要 |
<p>A semiconductor tester with features to facilitate testing of embedded memories. The circuitry allows tests to be generated algorithmically, but can be used in conjuction with scan test structures of semiconductor devices. Programming and debug time can be significantly reduced.</p> |
| 申请公布号 |
WO9837428(A1) |
申请公布日期 |
1998.08.27 |
| 申请号 |
WO1998US01885 |
申请日期 |
1998.02.02 |
| 申请人 |
TERADYNE, INC. |
发明人 |
BROWN, BENJAMIN, J.;DONALDSON, JOHN, F.;GUSINOW, KURT, B. |
| 分类号 |
G01R31/28;G01R31/317;G01R31/3181;G01R31/3183;G01R31/319;G11C29/56;(IPC1-7):G01R31/319 |
主分类号 |
G01R31/28 |
| 代理机构 |
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代理人 |
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