发明名称 X-ray diagnostics arrangement
摘要 <p>The diagnostic arrangement includes an X-ray source (2) for the production of an X-ray bundle (4), filter devices (3), a high voltage generator (1), and an X-ray image monitor chain (6 to 11) which comprises an X-ray image converter (6 to 9), an image system (10) and a monitor (11). A control arrangement (12) is provided, which is connected with the high voltage generator and the filter device. The control arrangement is formed in such way, that a defined measuring object (16) is brought into the X-ray bundle for testing the X-ray diagnostics arrangement. The high voltage generator triggers subsequently at least one defined radiation mode for producing image recordings, and the values of the high voltage generator are measured and stored in a data base (15). An evaluation circuit (13) is connected with the high voltage generator, different subsystems (8 to 11) of the X-ray image monitor chain, and the control arrangement. The evaluation circuit measures values at the subsystems of the X-ray image monitor chain during the different recordings, stores them in the data base, and uses them to produce measurement reports.</p>
申请公布号 DE19707728(A1) 申请公布日期 1998.08.27
申请号 DE1997107728 申请日期 1997.02.26
申请人 SIEMENS AG, 80333 MUENCHEN, DE 发明人 KOLLINGER, JOHANNES, DIPL.-ING. (FH), 91074 HERZOGENAURACH, DE;LUSSER, MARKUS, 91353 HAUSEN, DE
分类号 A61B6/00;G06T1/00;H05G1/26;(IPC1-7):H05G1/26 主分类号 A61B6/00
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