发明名称 Werkwijze en inrichting voor het opsporen en lokaliseren van onregelmatigheden in een diëlectricum.
摘要 The invention relates to a method for detecting at least one irregularity in the dielectric around a substantially elongate conductor, comprising of: applying a potential difference between the conductor and the earth; measuring at a first position voltage changes caused by said irregularity and moving in the direction of the first position; measuring at a second position voltage changes caused by said irregularity and moving in the direction of the second position; determining with the use of time registration the difference in arrival time of voltage changes caused by the same irregularity and measured at the first and second position; determining the position of the irregularity in said conductor on the basis of the, difference in arrival time and the length of said conductor between the first and second position.
申请公布号 NL1005349(C2) 申请公布日期 1998.08.26
申请号 NL19971005349 申请日期 1997.02.24
申请人 N.V. KEMA 发明人 DIRK MARINUS AARTRIJK
分类号 G01R31/12;G01R31/00;G01R31/08;G01S5/14 主分类号 G01R31/12
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