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发明名称
Probe card for testing integrated circuit chips
摘要
申请公布号
GB9814089(D0)
申请公布日期
1998.08.26
申请号
GB19980014089
申请日期
1998.07.01
申请人
SAMSUNG ELECTRONICS CO. LTD.
发明人
分类号
G01R31/26;G01R1/073;G01R31/28;H05K1/11;H05K13/08
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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