发明名称 SURFACE INSPECTING APPARATUS AND METHOD
摘要 PROBLEM TO BE SOLVED: To provide a surface inspecting apparatus and method which improve a measuring accuracy in the inspection of a surface based on output signals of two photodetectors. SOLUTION: An optical element 25 is provided and the optical axis of scanning light 32 incident into a mounted substrate 7 is moved by the optical element 25 so that positions of light irradiating photodetecting surfaces 91 of two photodetectors 9 coincide or almost coincide. Thus, surface information signals of an object to be inspected separately sent by the two photodetectors 9 can coincide with each other or a difference therebetween can be minimized, thereby improving measuring accuracy in the inspection of the surface.
申请公布号 JPH10227621(A) 申请公布日期 1998.08.25
申请号 JP19970033506 申请日期 1997.02.18
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 NAKASHIRO MASAHIRO;TATSUTA TAKESHI
分类号 G01B11/24;G01B11/245;G01N21/88;G01N21/956;H05K13/08 主分类号 G01B11/24
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