发明名称 |
SURFACE INSPECTING APPARATUS AND METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a surface inspecting apparatus and method which improve a measuring accuracy in the inspection of a surface based on output signals of two photodetectors. SOLUTION: An optical element 25 is provided and the optical axis of scanning light 32 incident into a mounted substrate 7 is moved by the optical element 25 so that positions of light irradiating photodetecting surfaces 91 of two photodetectors 9 coincide or almost coincide. Thus, surface information signals of an object to be inspected separately sent by the two photodetectors 9 can coincide with each other or a difference therebetween can be minimized, thereby improving measuring accuracy in the inspection of the surface. |
申请公布号 |
JPH10227621(A) |
申请公布日期 |
1998.08.25 |
申请号 |
JP19970033506 |
申请日期 |
1997.02.18 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
NAKASHIRO MASAHIRO;TATSUTA TAKESHI |
分类号 |
G01B11/24;G01B11/245;G01N21/88;G01N21/956;H05K13/08 |
主分类号 |
G01B11/24 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|