发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURE
摘要 PROBLEM TO BE SOLVED: To prevent degradation or other deterioration of the surface of a metal film when a gate is wired. SOLUTION: A method for manufacturing a semiconductor device is comprised of a process for forming a gate insulating film 15 on a semiconductor substrate 11, a process for forming a wiring film provided with a metal film 18 for gate wiring on the gate insulating film 15, a process for exposing the metal film 18 to an atmosphere in which the metal film 18 is likely to be oxidized, a process for reducing an oxide film formed on the surface of the metal film by the previous process in a reductant atmosphere and a process for forming a protective film 20 on the surface of the metal film 18 reduced by the previous process.
申请公布号 JPH10223900(A) 申请公布日期 1998.08.21
申请号 JP19970149161 申请日期 1997.06.06
申请人 TOSHIBA CORP 发明人 AKASAKA YASUSHI;NAKAJIMA KAZUAKI;MIYANO KIYOTAKA;SUGURO KYOICHI
分类号 H01L29/43;H01L21/28;H01L21/3205;H01L21/336;H01L21/60;H01L21/768;H01L23/52;H01L29/423;H01L29/49;H01L29/78;(IPC1-7):H01L29/78;H01L21/320 主分类号 H01L29/43
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