发明名称 |
SEMICONDUCTOR DEVICE AND ITS MANUFACTURE |
摘要 |
PROBLEM TO BE SOLVED: To prevent degradation or other deterioration of the surface of a metal film when a gate is wired. SOLUTION: A method for manufacturing a semiconductor device is comprised of a process for forming a gate insulating film 15 on a semiconductor substrate 11, a process for forming a wiring film provided with a metal film 18 for gate wiring on the gate insulating film 15, a process for exposing the metal film 18 to an atmosphere in which the metal film 18 is likely to be oxidized, a process for reducing an oxide film formed on the surface of the metal film by the previous process in a reductant atmosphere and a process for forming a protective film 20 on the surface of the metal film 18 reduced by the previous process. |
申请公布号 |
JPH10223900(A) |
申请公布日期 |
1998.08.21 |
申请号 |
JP19970149161 |
申请日期 |
1997.06.06 |
申请人 |
TOSHIBA CORP |
发明人 |
AKASAKA YASUSHI;NAKAJIMA KAZUAKI;MIYANO KIYOTAKA;SUGURO KYOICHI |
分类号 |
H01L29/43;H01L21/28;H01L21/3205;H01L21/336;H01L21/60;H01L21/768;H01L23/52;H01L29/423;H01L29/49;H01L29/78;(IPC1-7):H01L29/78;H01L21/320 |
主分类号 |
H01L29/43 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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