发明名称 |
INSULATION FILM, SEMICONDUCTOR DEVICE HAVING THE SAME AND MANUFACTURE THEREOF |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a low-dielectric const. wiring layer insulation amorphous fluorocarbon film durable to actual processes and manufacturing method thereof. SOLUTION: On both surface of an amorphous fluorcarbon film 43 inserted between wiring layers 3, 6, a diamond-like carbon film and Si-rich layer are disposed to greatly improve the adhesion to wirings adjust thereto and other insulation films. An Si type insulation film is laid on a multilayer substrate including the amorphous fluorocarbon film 43 having buried wiring layers 3, 6 to planarize it, and using this Si insulation film as a mask, the diamond-like carbon film and fluorocarbon layer 43 are anisotropically etched with an O- plasma to form via hole 7.</p> |
申请公布号 |
JPH10223625(A) |
申请公布日期 |
1998.08.21 |
申请号 |
JP19970148017 |
申请日期 |
1997.06.05 |
申请人 |
NEC CORP |
发明人 |
MATSUBARA YOSHIHISA;NOGUCHI KOU;ITO SHINYA;ODA NORIAKI;MATSUMOTO AKIRA;ISHIGAMI TAKASHI;NAKAMAE MASAHIKO;HORIUCHI TADAHIKO;ENDO KAZUHIKO;TATSUMI TORU;MATSUMOTO YOSHINARI |
分类号 |
H01L21/302;H01L21/205;H01L21/3065;H01L21/312;H01L21/314;H01L21/318;H01L21/768;H01L23/522;H01L23/532;(IPC1-7):H01L21/314;H01L21/306 |
主分类号 |
H01L21/302 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|