发明名称 INSULATION FILM, SEMICONDUCTOR DEVICE HAVING THE SAME AND MANUFACTURE THEREOF
摘要 <p>PROBLEM TO BE SOLVED: To provide a low-dielectric const. wiring layer insulation amorphous fluorocarbon film durable to actual processes and manufacturing method thereof. SOLUTION: On both surface of an amorphous fluorcarbon film 43 inserted between wiring layers 3, 6, a diamond-like carbon film and Si-rich layer are disposed to greatly improve the adhesion to wirings adjust thereto and other insulation films. An Si type insulation film is laid on a multilayer substrate including the amorphous fluorocarbon film 43 having buried wiring layers 3, 6 to planarize it, and using this Si insulation film as a mask, the diamond-like carbon film and fluorocarbon layer 43 are anisotropically etched with an O- plasma to form via hole 7.</p>
申请公布号 JPH10223625(A) 申请公布日期 1998.08.21
申请号 JP19970148017 申请日期 1997.06.05
申请人 NEC CORP 发明人 MATSUBARA YOSHIHISA;NOGUCHI KOU;ITO SHINYA;ODA NORIAKI;MATSUMOTO AKIRA;ISHIGAMI TAKASHI;NAKAMAE MASAHIKO;HORIUCHI TADAHIKO;ENDO KAZUHIKO;TATSUMI TORU;MATSUMOTO YOSHINARI
分类号 H01L21/302;H01L21/205;H01L21/3065;H01L21/312;H01L21/314;H01L21/318;H01L21/768;H01L23/522;H01L23/532;(IPC1-7):H01L21/314;H01L21/306 主分类号 H01L21/302
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