发明名称 CHIP THERMISTOR AND PRODUCTION THEREOF
摘要 <p>PROBLEM TO BE SOLVED: To protect a chip thermistor element against corrosion in plating while preventing protrusion of plating by forming a plating layer after applying a silane based compound denoted by a specified formula to the entire surface of the thermistor element on which a terminal electrode is formed. SOLUTION: A chip thermistor element 1, on which a terminal electrode 2A is formed, is immersed into an aqueous solution of silane based compound and then dried thus applying the silane based compound to the entire surface of the chip thermistor element 1. The silane based compound is shown by a formula (R<1> )x Si(OR<2> )4-x , where R<1> is a methyl group, an ethyl group, a propyl group or a butyl group, R<2> is an alkyl group, X is 1, 2 or 3. After a coating layer 4 of silane based compound is formed, an Ni plating layer 2B and a solder plating layer 2C are formed.</p>
申请公布号 JPH10223407(A) 申请公布日期 1998.08.21
申请号 JP19970029043 申请日期 1997.02.13
申请人 MITSUBISHI MATERIALS CORP 发明人 NAKAJIMA HIROAKI;OMURA TOMOHARU;ITO WATARU
分类号 H01C1/14;H01C7/04;H01C17/06;H01G4/252;(IPC1-7):H01C7/04 主分类号 H01C1/14
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