发明名称 MOSFET structure with first conductivity-type semiconductor substrate
摘要 The structure contains a drain (86), a spaced source (88) of second conductivity-type, and a gate electrode (94). On the substrate (84) is deposited a second conductivity-type layer (82), on whose surface are formed low doped drain and source, with the latter formed in the layer channel (92) of first conductivity-type. The gate electrode is located on the surface of the layer and channel and contains an edge (96) aligned with the source. The layer contains a region (98), extending from the drain and having an edge aligned with the opposite edge (102) of the gate electrode. The region has a second conductivity-type doping concentration, between that of the source and drain and that of the layer.
申请公布号 DE19733974(A1) 申请公布日期 1998.08.20
申请号 DE1997133974 申请日期 1997.08.06
申请人 NATIONAL SEMICONDUCTOR CORP., SANTA CLARA, CALIF., US 发明人 HUANG, ROBERT Y.S., OCOEE, FLA., US;EL-DIWANY, MONIR, SARATOGA, CALIF., US
分类号 H01L29/08;H01L29/78 主分类号 H01L29/08
代理机构 代理人
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