发明名称 Bandgap reference circuit
摘要 A voltage reference circuit that will remain constant and independent of changes in the operating temperature that is correlated to the bandgap voltage of silicon is described. The voltage reference circuit will be incorporated within an integrated circuit and will minimize currents into the substrate. The bandgap voltage reference circuit has a bandgap voltage referenced generator that will generate a first referencing voltage having a first temperature coefficient, and a compensating voltage generator that will generate a second referencing voltage having a second temperature coefficient. The second temperature coefficient is approximately equal and of opposite sign to the first temperature coefficient. A voltage summing circuit will sum the first referencing voltage and the second referencing voltage to create the temperature independent voltage. A voltage biasing circuit will couple a bias voltage to the bandgap voltage referenced generating means to bias the bandgap voltage referenced generator to generate the first referencing voltage. The voltage biasing circuit has a first MOSFET configured as first diode having an anode coupled to the power supply voltage source, and a second MOSFET configured as second diode having an anode coupled to the source of the first MOSFET and a cathode coupled to the ground reference point. The biasing voltage is developed at the connection of the cathode of the first diode and the anode of the second diode and said biasing voltage has a value a voltage drop across said second diode.
申请公布号 US5796244(A) 申请公布日期 1998.08.18
申请号 US19970893641 申请日期 1997.07.11
申请人 VANGUARD INTERNATIONAL SEMICONDUCTOR CORPORATION 发明人 CHEN, YUN SHENG;LIN, MING-ZEN
分类号 G05F3/30;(IPC1-7):G05F3/16 主分类号 G05F3/30
代理机构 代理人
主权项
地址
您可能感兴趣的专利