发明名称 Wafer heater assembly
摘要 A wafer heater assembly (8) for a deposition/etch chamber (2) includes a base (32) and a wafer support or chuck (36), having a wafer-chucking surface (76), spaced apart from the base by a circumferential barrier support (38). A heater sub-assembly (54) is mounted to the wafer support. Bolts (48) are used to secure the wafer support to the base with the barrier support therebetween to press the barrier support against an elastomeric O-ring, a metal V-seal or other fluid seal (46) positioned between the base and base end (42) of the barrier support. This eliminates the need to discard the entire heater assembly if the dielectric wafer-chucking surface becomes damaged. The temperature of the fluid seal is about 50 DEG -70 DEG C. lower than the temperature of the wafer-chucking surface when the wafer-chucking surface is about 200 DEG -300 DEG C.
申请公布号 US5796074(A) 申请公布日期 1998.08.18
申请号 US19950565185 申请日期 1995.11.28
申请人 APPLIED MATERIALS, INC. 发明人 EDELSTEIN, SERGIO;CHEN, STEVEN A.;PARKHE, VIJAY D.
分类号 C30B35/00;C23C14/50;C23C16/458;H01L21/02;H01L21/205;H01L21/31;(IPC1-7):F27B5/14 主分类号 C30B35/00
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