发明名称 |
Method of fabricating semiconductor device |
摘要 |
Method of fabricating a thin-film transistor. This transistor has a semiconductor such as a silicon semiconductor. This semiconductor is irradiated with pulsed laser light having a pulse width which is set greater than 1 mu s to maintain molten state of the silicon surface for a long time. As a result, a silicon film having high crystallinity can be obtained. This scheme can be used for crystallization of an amorphous silicon film and for activation effected after implantation of impurity ions.
|
申请公布号 |
US5795816(A) |
申请公布日期 |
1998.08.18 |
申请号 |
US19950452285 |
申请日期 |
1995.05.26 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
发明人 |
TERAMOTO, SATOSHI;TAKENOUCHI, AKIRA;OHTANI, HISASHI |
分类号 |
G02F1/136;G02F1/1368;H01L21/02;H01L21/20;H01L21/265;H01L21/336;H01L27/12;H01L29/78;H01L29/786;(IPC1-7):H01L21/20 |
主分类号 |
G02F1/136 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|