发明名称 Method of fabricating semiconductor device
摘要 Method of fabricating a thin-film transistor. This transistor has a semiconductor such as a silicon semiconductor. This semiconductor is irradiated with pulsed laser light having a pulse width which is set greater than 1 mu s to maintain molten state of the silicon surface for a long time. As a result, a silicon film having high crystallinity can be obtained. This scheme can be used for crystallization of an amorphous silicon film and for activation effected after implantation of impurity ions.
申请公布号 US5795816(A) 申请公布日期 1998.08.18
申请号 US19950452285 申请日期 1995.05.26
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 TERAMOTO, SATOSHI;TAKENOUCHI, AKIRA;OHTANI, HISASHI
分类号 G02F1/136;G02F1/1368;H01L21/02;H01L21/20;H01L21/265;H01L21/336;H01L27/12;H01L29/78;H01L29/786;(IPC1-7):H01L21/20 主分类号 G02F1/136
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