发明名称 Metal semiconductor field effect transistor (MESFET) device with single layer integrated metal
摘要 A periodic table group III-IV metal semiconductor metal field-effect transistor device is described. The disclosed device includes single metalization for ohmic and Schottky barrier contacts, an elective permanent etch stop layer, a non-alloyed ohmic contact semiconductor layer and a permanent non photosensitive secondary mask element. The invention may be achieved with one of an all optical lithographic process and a combined optical and electron beam lithographic process The disclosed field-effect transistor device is of reduced fabrication cost, increased dimensional accuracy and state of the art electrical performance.
申请公布号 US5796131(A) 申请公布日期 1998.08.18
申请号 US19960684759 申请日期 1996.07.22
申请人 THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE AIR FORCE 发明人 NAKANO, KENICHI;BOZADA, CHRISTOPHER A.;QUACH, TONY K.;DESALVO, GREGORY C.;VIA, G. DAVID;DETTMER, ROSS W.;HAVASY, CHARLES K.;SEWELL, JAMES S.;EBEL, JOHN L.;GILLESPIE, JAMES K.
分类号 H01L21/285;H01L21/338;H01L21/76;H01L29/47;H01L29/812;(IPC1-7):H01L29/80 主分类号 H01L21/285
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