发明名称 Method of fabricating metal line structure
摘要 A method of fabricating a metal line includes the steps of preparing a semiconductor substrate, depositing a first metal on the semiconductor substrate, heat-treating the first metal to form a first metal nitride layer, depositing a second metal on the first metal nitride layer, heat treating the second metal, depositing a third metal on the second metal, and heat treating both the third metal and the second metal to form a metal insulating layer in which the second and the third metals are mixed. The method of fabricating increases the area occupied by the metal line in a contact hole, decreases contact resistance, and increases the speed of the device.
申请公布号 US5795796(A) 申请公布日期 1998.08.18
申请号 US19960634531 申请日期 1996.04.18
申请人 LG SEMICON CO., LTD. 发明人 KIM, DO HEYOUNG
分类号 H01L21/28;H01L21/768;H01L23/522;H01L23/532;(IPC1-7):H01L21/29 主分类号 H01L21/28
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